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 NTB90N02, NTP90N02 Power MOSFET 90 Amps, 24 Volts
N-Channel D2PAK and TO-220
Designed for low voltage, high speed switching applications in power supplies, converters and power motor controls and bridge circuits.
Features
V(BR)DSS
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RDS(on) TYP 5.0 mW @ 10 V 7.5 mW @ 4.5 V N-Channel D ID MAX
* Pb-Free Packages are Available
Typical Applications
24 V 90 A
* * * *
Power Supplies Converters Power Motor Controls Bridge Circuits
G Unit Vdc Vdc 4 A A W W/C C mJ 1 2 3
MAXIMUM RATINGS (TJ = 25C unless otherwise noted)
Rating Drain-to-Source Voltage Gate-to-Source Voltage - Continuous Drain Current - Continuous @ TA = 25C - Single Pulse (tp = 10 ms) Total Power Dissipation @ TA = 25C Derate above 25C Operating and Storage Temperature Single Pulse Drain-to-Source Avalanche Energy - Starting TJ = 25C (VDD = 28 Vdc, VGS = 10 Vdc, L = 5.0 mH, IL(pk) = 17 A, RG = 25 W) Thermal Resistance Junction-to-Case Junction-to-Ambient (Note 1) Maximum Lead Temperature for Soldering Purposes, 1/8 from case for 10 seconds Symbol VDSS VGS ID IDM PD TJ, Tstg EAS Value 24 "20 90* 200 85 0.66 -55 to +150 733
S
MARKING DIAGRAMS
4 Drain
TO-220AB CASE 221A STYLE 5
NTx90N02 AYWW
1 Gate 2 Drain 4 Drain
3 Source
C/W RqJC RqJA TL 1.55 70 260 C 4 1 2 3 1 Gate NTx90N02 x A Y WW = Device Code = P or B = Assembly Location = Year = Work Week D2PAK CASE 418B STYLE 2
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected. 1. When surface mounted to an FR4 board using 1 pad size, (Cu Area 1.127 in2). 2. When surface mounted to an FR4 board using minimum recommended pad size, (Cu Area 0.412 in2). *Chip current capability limited by package.
NTx90N02 AYWW
2 Drain
3 Source
ORDERING INFORMATION
See detailed ordering and shipping information in the package dimensions section on page 4 of this data sheet.
(c) Semiconductor Components Industries, LLC, 2005
1
March, 2005 - Rev. 2
Publication Order Number: NTB90N02/D
NTB90N02, NTP90N02
ELECTRICAL CHARACTERISTICS (TJ = 25C unless otherwise noted)
Characteristic OFF CHARACTERISTICS Drain-to-Source Breakdown Voltage (Note 3) (VGS = 0 Vdc, ID = 250 mAdc) Temperature Coefficient (Positive) Zero Gate Voltage Drain Current (VDS = 24 Vdc, VGS = 0 Vdc) (VDS = 24 Vdc, VGS = 0 Vdc, TJ = 150C) Gate-Body Leakage Current (VGS = $ 20 Vdc, VDS = 0 Vdc) ON CHARACTERISTICS (Note 3) Gate Threshold Voltage (Note 3) (VDS = VGS, ID = 250 mAdc) Threshold Temperature Coefficient (Negative) Static Drain-to-Source On-Resistance (Note 3) (VGS = 10 Vdc, ID = 90 Adc) (VGS = 4.5 Vdc, ID = 40 Adc) (VGS = 10 Vdc, ID = 20 Adc) (VGS = 4.5 Vdc, ID = 20 Adc) Forward Transconductance (Note 3) (VDS = 15 Vdc, ID = 10 Adc) DYNAMIC CHARACTERISTICS Input Capacitance Output Capacitance Transfer Capacitance SWITCHING CHARACTERISTICS (Note 4) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Gate Charge (VDS = 20 Vdc, ID = 20 Adc, VGS = 4.5 Vdc) (Note 3) 45 (VDD = 20 Vdc, ID = 20 Adc, VGS = 4 5 Vdc RG = 2 5 W) 4.5 Vdc, 2.5 td(on) tr td(off) tf QT Q1 Q2 SOURCE-DRAIN DIODE CHARACTERISTICS Forward On-Voltage (IS = 2.3 Adc, VGS = 0 Vdc) (IS = 40 Adc, VGS = 0 Vdc) (Note 3) (IS = 2.3 Adc, VGS = 0 Vdc, TJ = 150C) (IS = 2.3 Adc, VGS = 0 Vdc, dIS/dt = 100 A/ms) (Note 3) VSD - - - - - - - 0.75 1.2 0.65 40 21 18 0.036 1.0 - - - - - - mC Vdc - - - - - - - 16 90 28 60 29 8.0 20 - - - - - - - nC ns (VDS = 20 Vdc, VGS = 0 Vdc, f = 1 0 MHz) 1.0 Ciss Coss Crss - - - 2120 900 360 - - - pF VGS(th) 1.0 - RDS(on) - - - - gFS - 5.0 7.5 5.0 7.5 25 5.8 9.0 5.8 9.0 - mhos 1.9 -3.8 3.0 - Vdc mV/C mW V(BR)DSS 24 - IDSS - - IGSS - - - - 1.0 10 100 nAdc 27 25 - - Vdc mV/C mAdc Symbol Min Typ Max Unit
Reverse Recovery Time
trr ta tb
ns
Reverse Recovery Stored Charge 3. Pulse Test: Pulse Width 300 ms, Duty Cycle 2%. 4. Switching characteristics are independent of operating junction temperatures.
QRR
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2
NTB90N02, NTP90N02
100 90 ID, DRAIN CURRENT (AMPS) 80 70 60 50 40 30 20 10 0 0 0.5 1 1.5 2 2.5 3 3.5 4 VDS, DRAIN-TO-SOURCE VOLTAGE (V) 3.4 V 3.2 V VGS = 3.0 V 6.5 V 9V 8V 4.4 V 4.6 V 4.8 V 5V 5.2 V 6V TJ = 25C 4.2 V 4V 3.8 V 3.6 V 160 150 140 130 120 110 100 90 80 70 60 50 40 30 20 10 0 VDS 24 V
ID, DRAIN CURRENT (AMPS)
TJ = 25C
TJ = 125C TJ = -55C 2 3 4 5 6
VGS, GATE-TO-SOURCE VOLTAGE (V)
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
RDS(on), DRAIN-TO-SOURCE RESISTANCE (W)
0.07 0.06 0.05 0.04 0.03 0.02 0.01 0 0 2 4 6 8 10 VGS, GATE-TO-SOURCE VOLTAGE (V) ID = 10 A TJ = 25C
RDS(on), DRAIN-TO-SOURCE RESISTANCE (W)
0.015 TJ = 25C
0.01
VGS = 4.5 V
VGS = 10 V 0.005
0 55
60
65
70
75
80
85
90
ID, DRAIN CURRENT (A)
RDS(on), DRAIN-TO-SOURCE RESISTANCE (NORMALIZED)
Figure 3. On-Resistance versus Gate-To-Source Voltage
0.015 0.0125 0.001 0.0075 0.005 0.0025 0 -50 ID = 10 A VDS = 10 V ID = 90 A VDS = 4.5 V IDSS, LEAKAGE (nA)
Figure 4. On-Resistance versus Drain Current and Gate Voltage
1000 VGS = 0 V 100 TJ = 125C TJ = 100C 10
1 TJ = 25C 0.1
-25
0
25
50
75
100
125
150
0.01
4
8
12
16
20
TJ, JUNCTION TEMPERATURE (C)
VDS, DRAIN-TO-SOURCE VOLTAGE (V)
Figure 5. On-Resistance Variation with Temperature
Figure 6. Drain-To-Source Leakage Current versus Voltage
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3
NTB90N02, NTP90N02
-VDS, DRAIN-TO-SOURCE VOLTAGE (V)
5000
VGS, GATE-TO-SOURCE VOLTAGE (V)
VGS = 0 V TJ = 25C
10 28 8 VD Q1 Q2 QT VGS 24 20 16 4 12 8 2 ID = 1.0 A TJ = 25C 0 0 10 20 30 40 50 4 0
C, CAPACITANCE (pF)
4000
3000 Ciss 2000 Coss 1000 0 -8 -6 -4 -2 0 2 4 VGS VDS Crss
6
6
8 10 12 14 16 18 20 22 24
GATE-TO-SOURCE OR DRAIN-TO-SOURCE VOLTAGE (V)
Qg, TOTAL GATE CHARGE (nC)
Figure 7. Capacitance Variation
Figure 8. Gate-to-Source and Drain-to-Source Voltage versus Total Charge
1000 IS, SOURCE CURRENT (AMPS) VDD = 20 V ID = 20 A VGS = 10 V t, TIME (ns) 100 tr tf td(off) td(on)
90 80 70 60 50 40 30 20 10 0 0.55 0.60 0.65 0.70 0.75 0.80 0.85 0.90 0.95 1.00 VSD, SOURCE-TO-DRAIN VOLTAGE (V) VGS = 0 V TJ = 25C
10
1 1 10 RG, GATE RESISTANCE (W) 100
Figure 9. Resistive Switching Time Variation versus Gate Resistance
Figure 10. Diode Forward Voltage versus Current
ORDERING INFORMATION
Device NTP90N02 NTP90N02G NTB90N02 NTB90N02G NTB90N02T4 NTB90N02T4G Package TO-220AB TO-220AB (Pb-Free) D2PAK D2PAK (Pb-Free) D2PAK D2PAK (Pb-Free) Shipping 50 Units / Rail 50 Units / Rail 50 Units / Rail 50 Units / Rail 800 Tape & Reel 800 Tape & Reel
For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D.
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4
NTB90N02, NTP90N02
POWER MOSFET SWITCHING Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (Dt) are determined by how fast the FET input capacitance can be charged by current from the generator. The published capacitance data is difficult to use for calculating rise and fall because drain-gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that
t + Q IG(AV)
During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following:
tr + Q2 tf + Q2 R2 10(VGG * VGSP) R2 VGSP
where: VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance and Q2 and VGSP are read from the gate charge curve. During the turn-on and turn-off delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are:
td(on) + RG Ciss In [VGG (VGG * VGSP)] td(off) + RG Ciss In (VGG VGSP)
The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off-state condition when calculating td(on) and is read at a voltage corresponding to the on-state when calculating td(off). At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
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NTB90N02, NTP90N02
PACKAGE DIMENSIONS
D2PAK CASE 418AA-01 ISSUE O
-B-
4
C E V W
NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. INCHES MIN MAX 0.340 0.380 0.380 0.405 0.160 0.190 0.020 0.036 0.045 0.055 0.310 --- 0.100 BSC 0.018 0.025 0.090 0.110 0.280 --- 0.575 0.625 0.045 0.055 GATE DRAIN SOURCE DRAIN MILLIMETERS MIN MAX 8.64 9.65 9.65 10.29 4.06 4.83 0.51 0.92 1.14 1.40 7.87 --- 2.54 BSC 0.46 0.64 2.29 2.79 7.11 --- 14.60 15.88 1.14 1.40
1
2
3
S A
-T-
SEATING PLANE
G K D
3 PL M
W J
0.13 (0.005) VARIABLE CONFIGURATION ZONE
TB
M
DIM A B C D E F G J K M S V
STYLE 2: PIN 1. 2. 3. 4.
U
M
M
M
F VIEW W-W 1
F VIEW W-W 2
F VIEW W-W 3
SOLDERING FOOTPRINT*
8.38 0.33
10.66 0.42
1.016 0.04
5.08 0.20
3.05 0.12 17.02 0.67
SCALE 3:1 mm inches
*For additional information on our Pb-Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
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6
NTB90N02, NTP90N02
PACKAGE DIMENSIONS
TO-220 CASE 221A-09 ISSUE AA
NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. 3. DIMENSION Z DEFINES A ZONE WHERE ALL BODY AND LEAD IRREGULARITIES ARE ALLOWED. DIM A B C D F G H J K L N Q R S T U V Z INCHES MIN MAX 0.570 0.620 0.380 0.405 0.160 0.190 0.025 0.035 0.142 0.147 0.095 0.105 0.110 0.155 0.018 0.025 0.500 0.562 0.045 0.060 0.190 0.210 0.100 0.120 0.080 0.110 0.045 0.055 0.235 0.255 0.000 0.050 0.045 --- --- 0.080 GATE DRAIN SOURCE DRAIN MILLIMETERS MIN MAX 14.48 15.75 9.66 10.28 4.07 4.82 0.64 0.88 3.61 3.73 2.42 2.66 2.80 3.93 0.46 0.64 12.70 14.27 1.15 1.52 4.83 5.33 2.54 3.04 2.04 2.79 1.15 1.39 5.97 6.47 0.00 1.27 1.15 --- --- 2.04
B
4
F C T A S
-T-
SEATING PLANE
Q
123
H K Z L V G D N
U
R J
STYLE 5: PIN 1. 2. 3. 4.
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7
NTB90N02, NTP90N02
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. "Typical" parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 61312, Phoenix, Arizona 85082-1312 USA Phone: 480-829-7710 or 800-344-3860 Toll Free USA/Canada Fax: 480-829-7709 or 800-344-3867 Toll Free USA/Canada Email: orderlit@onsemi.com N. American Technical Support: 800-282-9855 Toll Free USA/Canada Japan: ON Semiconductor, Japan Customer Focus Center 2-9-1 Kamimeguro, Meguro-ku, Tokyo, Japan 153-0051 Phone: 81-3-5773-3850 ON Semiconductor Website: http://onsemi.com Order Literature: http://www.onsemi.com/litorder For additional information, please contact your local Sales Representative.
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8
NTB90N02/D


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